System-level Testing at XRCF
| This page is http://space.mit.edu.ezproxyberklee.flo.org/HETG/ia/perform_4.html | 1998-12-06 |
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Grating Spectrometer Performance Tests: System-level Testing at XRCF |
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| Grating Period w/HXDS | PSF and LRF w/HXDS | PSF and LRF w/Flight Detector | Other PSF Tests | |
| HETG : | Beam Center Test: FPC pin hole scan of diffracted orders, Al-K, Mg-K | Al-K, Mg-K images w/HSI; Mg-K slit scans | Verify Rowland geometry with quadrant shutter focus images, Al-K, Si-K | HEG scatter w/'2C and ACIS-S; MEG mis-aligned gratings w/HSI images |
| LETG : | Beam Center Test | above plus: Penning 130 A images, Ti-K images | Penning 130 and 160 A; Mg-K orders | Plate scale w/HRC-S; Scatter w/ACIS-S |
| Grating Efficiency w/HXDS | Absolute Area w/Flight Detector | Eff. Area Features vs Energy | Other Effic. Tests | |
| HETG : | Grating In/Out Tests using FPC w/apertures | ACIS-S with DCM | Continuum spectra of C and Cu w/ACIS-S | High-order effic.s |
| LETG : | Grating In/Out Tests using FPC w/apertures | Relative effic.s (HRC modified post-XRCF) | Continuum spectra of C and Cu w/ACIS-S | Support structure and high-order effic.s |
| HETG Calibration: http://space.mit.edu.ezproxyberklee.flo.org/HETG/xrcf.html | perf-4, --> |